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Wafer resistance measurement apparatus and method using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer scale burn-in apparatus and process

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer scale burn-in apparatus and process

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer scale high density probe assembly, apparatus for use...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Wafer scale testing of redundant integrated circuit dies

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer shielding chamber for probe station

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer stage storage structure speed testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer staging platform for a wafer inspection system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer test and burn-in platform using ceramic tile supports

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer test apparatus including optical elements and method...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer test apparatus including optical elements and method...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer test apparatus including optical elements and method...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer test equipment and method of aligning test equipment

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer test fixture using a biasing bladder and methodology

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer test head architecture and method of use

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer test method utilizing conductive interposer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer test method with probe card having on-board multiplex...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer testing interposer for a conventional package

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Wafer testing system integrated with RFID techniques and...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Wafer transfer device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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