Wafer test apparatus including optical elements and method...

Details Wafer test apparatus including optical elements and method... Wafer test apparatus including optical elements and method...

2007-07-31

2007-07-31

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C438S016000

Reexamination Certificate

active

11006184

ABSTRACT:
Wafer-level testing is performed on an electronic device to be used in an optical communications system. An optical test signal is generated and is provided to a first photo detector. An electrical output of the first photo detector is supplied to the electronic device on the wafer. An electrical output from the electronic device on the wafer is used to drive a light source. An optical output of the light source is supplied to a second photo detector and an electrical signal output from the second photo detector is examined.

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