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IC socket, a test method using the same and an IC socket...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC socket, a test method using the same and an IC socket...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC tester

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC tester adjusting unit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC tester and IC test method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC tester and measuring method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC tester joined with ion beam tester and the detection method o

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC testing apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC testing apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC testing apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC testing apparatus and testing method using same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC testing device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC testing device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC testing device adapted to selectively use I/O common system a

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC testing method and apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC testing method and IC testing device using the same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IC with first and second distributors collectors and scan paths

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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ICT test fixture for fine pitch testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IDDQ test methodology based on the sensitivity of fault...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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IDDQ test methodology based on the sensitivity of fault...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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