IC testing device adapted to selectively use I/O common system a

Details IC testing device adapted to selectively use I/O common system a IC testing device adapted to selectively use I/O common system a

1997-09-30

2000-02-01

Do, Diep N.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, 3241581, 714719, G01R 3128

Patent

active

060207523

ABSTRACT:
In an IC testing device, first and second analog comparators for comparing response waveforms from an I/O pin and an output-dedicated pin of an IC under test and a selector for selecting either one of the outputs from the two analog comparators are provided. By switching the outputs of the analog comparators one from the other with the selector, the conventional I/O common system is used to carry out measurement for the I/O pin of the IC under test and the conventional I/O split system is used to carry out measurement for the input- and output-dedicated pins of the IC.

REFERENCES:
patent: 5101153 (1992-03-01), Morong, III
patent: 5225772 (1993-07-01), Cheung et al.
patent: 5241264 (1993-08-01), Nishiura
patent: 5402079 (1995-03-01), Levy
patent: 5422892 (1995-06-01), Hii et al.
patent: 5590137 (1996-12-01), Yamashita

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