Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-23
2011-08-23
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010, C714S726000, C714S729000
Reexamination Certificate
active
08004298
ABSTRACT:
An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus test data to functional circuits (702) on the integrated circuit and receive response test data from the functional circuits. A scan distributor circuit (800) receives serial test data from a peripheral bond pad (802) and distributes it to each parallel scan path. A scan collector circuit (844) collects test data from the parallel scan paths and applies it to a peripheral bond pad (866). This enables more parallel scan paths of shorter length to connect to the functional circuits. The scan distributor and collector circuits can be respectively connected in series to provide parallel connections to more parallel scan paths. Additionally multiplexer circuits (886,890) can selectively connect pairs of scan distributor and collector circuits together. The scan distributor and collector circuits can be formed in core circuits (704). The core circuits then can be connected to other core circuits and functional circuits with simple connections to the parallel scan circuits through the scan distributor and collector circuits.
REFERENCES:
patent: 4829237 (1989-05-01), Segawa et al.
patent: 5563524 (1996-10-01), Ungar
patent: 6646460 (2003-11-01), Whetsel
patent: 7459926 (2008-12-01), Whetsel
patent: 7852100 (2010-12-01), Whetsel
patent: 7859275 (2010-12-01), Whetsel
patent: 7863913 (2011-01-01), Whetsel
patent: 7876112 (2011-01-01), Whetsel
U.S. Appl. No. 12/952,773—claims filed Jan. 5, 2011.
Bassuk Lawrence J.
Brady W. James
Isla Rodas Richard
Phan Huy Q
Telecky , Jr. Frederick J.
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