IC tester and measuring method

Details IC tester and measuring method IC tester and measuring method

1995-02-02

1996-11-12

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

439 71, G01R 104, G01R 3126

Patent

active

055743838

ABSTRACT:
An IC measuring and testing device and measuring and testing method comprising a measurement handler socket provided with mold-receiving base having guiding members corresponding to the shape of a mold body of an IC to be tested around its periphery and probes for contacting outer leads of the IC, and a suction arm for suction-supporting the IC and transferring it to the mold-receiving base, the IC measuring and testing device performing measuring and testing on the IC mounted in the mold-receiving base by means of the suction arm, the guide members corresponding to and separated from the outer leads of the IC, and terminal portions of the probes being arranged inserted into these separation portions. As a result, when the IC is set, the guide members and the like of the socket can be prevented from striking against the outer leads of the IC and deforming them.

REFERENCES:
patent: 4739257 (1988-04-01), Jenson et al.
patent: 4789345 (1988-12-01), Carter
patent: 4869636 (1989-09-01), Reid et al.
patent: 5068601 (1991-11-01), Parmenter
patent: 5143450 (1992-09-01), Smith et al.
patent: 5151651 (1992-09-01), Shibata
patent: 5172049 (1992-12-01), Kiyokawa et al.

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