IC testing device

Details IC testing device IC testing device

1997-09-24

2000-07-11

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3126

Patent

active

060878444

ABSTRACT:
The object of the present invention is to offer an IC testing device capable of operating a plurality of test stations independently of each other. A solid-state relay 11 is provided on each test station, and performs ON/OFF control of a 200 V AC supply to a first power source 9 and a second power source 10. Additionally, the analog circuit 7 and pin electronics section 8 of each test station are respectively connected to a DC section 5 of an IC testing device main body 2 by testing buses. Similarly, the analog circuit 7 and pin electronics section 8 of each test station are respectively connected to an LS section 6 of an IC testing device main body 2 by testing buses. Consequently, each unit of a test station is capable of exchanging data with the IC testing device main body 2 even if only the solid-state relay 11 of one testing station is ON.

REFERENCES:
patent: 4942358 (1990-07-01), Davis et al.
patent: 5640102 (1997-06-01), Sato

Affiliated with

Also associated with

Rating

IC testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with IC testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and IC testing device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-545595