IDDQ test methodology based on the sensitivity of fault...

Details IDDQ test methodology based on the sensitivity of fault... IDDQ test methodology based on the sensitivity of fault...

2005-01-11

2005-01-11

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

06842032

ABSTRACT:
A method for testing integrated circuits is provided. The method includes providing an excitation voltage to a device, such as a MOSFET. A power supply voltage is also provided to the device, such as a drain to source voltage or VCC. The quiescent power supply current of the device is then measured, such as the IDDQ of the MOSFET. The power supply voltage to the device is then varied, and it is determined whether a change in the IDDQ of the device exceeds a predetermined allowable change.

REFERENCES:
patent: 5731700 (1998-03-01), McDonald
patent: 6118293 (2000-09-01), Manhaeve et al.

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