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Direct jitter analysis of binary sampled data

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Disambiguating like testable objects in a functional testing...

Data processing: measuring – calibrating – or testing – Testing system – Including program set up
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Disc drive testing system and method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Disc interface, disc interface system having the same, and...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Disk drive grouping in a multi-cell disk drive test system

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Disk drive testing

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Disk drive testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Dispenser with updatable diagnostic system

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
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Distributed sensor network with a common processing platform...

Data processing: measuring – calibrating – or testing – Testing system
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Distributed test system and method

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments
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Distributed trigger node

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Driver with transmission path loss compensation

Data processing: measuring – calibrating – or testing – Testing system
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Dynamic component to input signal mapping system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Dynamic creation and modification of wafer test maps during...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Dynamic determination of a minimal configured product to...

Data processing: measuring – calibrating – or testing – Testing system
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Dynamic measurement control

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Dynamic relative load rate for fluid systems

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Dynamic routing for a measurement system

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
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Dynamic runtime modification of SCPI grammar

Data processing: measuring – calibrating – or testing – Testing system – Including program set up
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Dynamically adaptable semiconductor parametric testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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