Dynamic runtime modification of SCPI grammar

Details Dynamic runtime modification of SCPI grammar Dynamic runtime modification of SCPI grammar

2005-12-13

2005-12-13

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

C702S121000, C702S122000

Reexamination Certificate

active

06975957

ABSTRACT:
Alteration of a Standard Commands for Programmable Instrumentation (SCPI) command set for instrument control. In representative embodiments, each command of the command set includes a different combination of SCPI grammatical elements; the SCPI grammatical elements are organized hierarchically in a tree data structure; and the tree has nodes with each node comprising one of the SCPI grammatical elements. A node to alter is selected, and an alteration to the selected node is specified. Access to the selected node, as well as to any descendant nodes of the selected node is restricted; the selected node is altered in accordance with the specified alteration, wherein the alteration of the selected node is performed at runtime; and the access restriction to the selected node and to any descendant nodes of the selected node is removed, wherein the access restriction, node alteration, and access removal are performed while the instrument is operational.

REFERENCES:
patent: 2002/0010714 (2002-01-01), Hetherington
patent: 2004/0009813 (2004-01-01), Wind
U.S. Appl. No. 10/825,465, filed Apr. 15, 2004, Timothy Nephi Tillotson et al.
U.S. Appl. No. 10/824,973, filed Apr. 15, 2004, Timothy Nephi Tillotson et al.
U.S. Appl. No. 10/825,466, filed Apr. 15, 2004, Timothy Nephi Tillotson et al.
U.S. Appl. No. 10/824,683, filed Apr. 15, 2004, Timothy Nephi Tillotson et al.

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