Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2003-06-19
2009-12-22
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S117000
Reexamination Certificate
active
07636642
ABSTRACT:
A technique for determining the timing location and/or jitter of a signal edge includes computing differences between pairs of adjacent samples of the signal edge to yield difference values. First and second statistical moments are computed directly from the difference values, and mean edge location and standard deviation are computed from the first and second moments.
REFERENCES:
patent: 4756008 (1988-07-01), Yagi et al.
patent: 5566215 (1996-10-01), Coquerel
patent: 6460001 (2002-10-01), Yamaguchi et al.
patent: 6694462 (2004-02-01), Reiss et al.
patent: 7143323 (2006-11-01), Sweet
patent: 2004/0117692 (2004-06-01), Sweet
patent: 2004/0128591 (2004-07-01), Ihs et al.
Wikipedia, “Root Mean Square”, pp. 1-4, last modified Oct. 1, 2007.
Hallé Francine
Monk Leonard G
K&L Gates LLP
Nghiem Michael P
Teradyne, Inc.
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