Distributed test system and method

Details Distributed test system and method Distributed test system and method

2011-08-23

2011-08-23

Nghiem, Michael P (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including multiple test instruments

C702S116000, C702S118000, C702S122000

Reexamination Certificate

active

08005638

ABSTRACT:
Provided is a distributed test system and method for electrical devices that features bifurcated testing and analysis of test results for electrical devices by aggregating test results from multiple testing systems to a centralized server where analysis of test data is undertaken. The system includes a plurality of testing systems, each of which is configured to operate test software to provide electrical stimuli to devices under test (DUTs) and obtain measured metrics indicative of actual operational characteristics (AOCs) of the DUTs. A decision support system (DSS) is selectively placed in data communication with the plurality of testing systems to receive the measured metrics from each of the plurality of testing systems. The DSS is configured to operate on software and compare desired metrics, indicative of desired operational characteristics (DOCs) of each of the DUTs, with the measured metrics and provide a plurality of operational characteristic determinations (OCDs).

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patent: 2008/0126903 (2008-05-01), Wegener
patent: 2008/0256406 (2008-10-01), Arnold

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