Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-09-27
2005-09-27
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C710S001000
Reexamination Certificate
active
06950772
ABSTRACT:
A dynamic component to input signal mapping system is disclosed that receives different types of input signals applied to a number of components and provides resultant output signals. The system includes input ports receiving the input signals, output ports providing the output signals, and a number of components processing the input signals, each of the components having at least one input and one output. The system includes a test signal source coupled to the components. Additionally, a signal analyzer coupled to an output of components analyzes response signals output from the components in response to test signals. The system is operative to map at least one component to receive at least one input signal based on the analyzed response. The system allows components on a semiconductor chip to be dynamically reconfigured for optimal processing of different types of signals, such as video and audio signals.
REFERENCES:
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patent: 5715197 (1998-02-01), Nance et al.
patent: 5937202 (1999-08-01), Crosetto
patent: 5990862 (1999-11-01), Lewis
patent: 6687865 (2004-02-01), Dervisoglu et al.
ATI International SRL
Hoff Marc S.
Raymond Edward
Vedder Price Kaufman & Kammholz P.C.
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