LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Measurement system in a specific environment,Quality evaluation

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Method and system for measurement data evaluation in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method and system for measurement data evaluation in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method and system for monitoring service quality in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system for providing quality control on wafers...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system for random sampling

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system for the automatic design of experiments

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system for tracking manufacturing data for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system for tracking manufacturing data for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system of providing a dynamic sampling plan for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system of semiconductor fabrication fault analysis

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system of testing device sensitivity

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method and system to develop a process improvement methodology

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for analyzing final test parameters

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for analyzing in-line QC test parameters

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for analyzing wafer test parameters

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method for automated exception-based quality control...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for automated exception-based quality control...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method for complex products configuration and guarantee...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for controlling a manufacturing process utilizing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Method for controlling manufacturing processes via efficient exp

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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