LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Measurement system in a specific environment,Quality evaluation

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In-die part measurement system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inline clustered defect reduction

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection and verification system and method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection condition setting program, inspection device and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection data analysis program, inspection tools, review...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection method and its apparatus, inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Inspection method and its apparatus, inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection plan optimization based on layout attributes and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection system for and method of confirming soundness of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection system setup techniques

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection system setup techniques

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection system, inspection apparatus, inspection program,...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Inspection window guard banding

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Integrated defect yield management and query system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Integrated system for detecting and repairing semiconductor...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Interactive information package

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Interactive remote sample analysis system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Patent

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Interactive remote sample analysis system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Ion implant metrology system with fault detection and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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