Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2006-04-03
2008-11-11
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C702S081000, C702S182000, C702S123000, C717S101000
Reexamination Certificate
active
07451051
ABSTRACT:
A method to create an instance of a defect-based production and testing process analysis machine (DPTPAM) provides continual process improvement based on foundational questions and classified defect data. The method includes the following steps: obtaining domain specific questions; developing a domain specific classification scheme that supports the answering of the foundational and domain specific questions; determining a method of using the domain specific classification scheme to answer both the foundational and domain specific questions; and creating a domain specific DPTPAM instance embodying the domain specific classification scheme and the method of answering the foundational and domain specific questions. The method can be implemented with a machine and a computer readable medium comprising logic for performing the method.
REFERENCES:
patent: 4866635 (1989-09-01), Kahn et al.
patent: 2005/0114829 (2005-05-01), Robin et al.
patent: 2007/0067293 (2007-03-01), Yu
Kratschmer Theresa
Malkin Peter Kenneth
Santhanam Padmanabhan
Barlow Jr. John E.
Buchenhorner Michael J.
International Business Machines - Corporation
Vazken Alexanian
Vo Hien X
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