LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Measurement system in a specific environment,Quality evaluation

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Sampling inspection managing system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Sampling inspection method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Semiconductor process yield analysis based on evaluation of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Semiconductor production system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Semiconductor production system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Semiconductor test apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Semiconductor testing method and semiconductor testing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Sequential unique marking

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Sequential unique marking

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Sequential unique marking

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Signal processing circuit outputting a signal representing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Statistical impact analysis computer system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Statistical method of monitoring gate oxide layer yield

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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Substrate measuring method, computer-readable recording...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for analyzing different scenarios for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for controlling critical dimension in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for dynamically providing feedback

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for estimating reliability of components...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for estimating reliability of components...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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System and method for evaluating craftsmanship

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

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