Method and system for random sampling

Details Method and system for random sampling Method and system for random sampling

2005-07-26

2005-07-26

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

C702S083000, C702S122000, C702S022000, C702S182000, C702S183000

Reexamination Certificate

active

06922646

ABSTRACT:
A method and system for providing quality control through random sampling is provided. The system includes several modules for supporting the random sampling. A first module is adapted to select a technician for performing a procedure in association with an instrument. A second module is adapted to identify a random position for placement of a quality control on the equipment. A third module is adapted to select a random time interval for the selected technician to perform the procedure. A fourth module is adapted to select any analyzable specimen for repeat analysis or for selecting a patient sample for repeat analysis. Accordingly, the four modules enable random selection of several variables including the selection of the technician, instrument, position, time, and repeat testing.

REFERENCES:
patent: 4472784 (1984-09-01), Blachman
patent: 4580226 (1986-04-01), Bennison
patent: 5461570 (1995-10-01), Wang et al.
patent: 5532941 (1996-07-01), Lin
patent: 5696686 (1997-12-01), Sanka et al.
patent: 5937364 (1999-08-01), Westgard et al.
patent: 6027691 (2000-02-01), Watts et al.
patent: 6269276 (2001-07-01), Akhavan et al.
patent: 6556951 (2003-04-01), Deleo et al.
patent: 63251309 (1990-04-01), None

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