Method and system of testing device sensitivity

Details Method and system of testing device sensitivity Method and system of testing device sensitivity

2011-07-12

2011-07-12

Dunn, Drew A (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

Reexamination Certificate

active

07979225

ABSTRACT:
Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.

REFERENCES:
patent: 5327437 (1994-07-01), Balzer
patent: 7203460 (2007-04-01), Boose et al.
patent: 7209722 (2007-04-01), Huhtala
patent: 2004/0120406 (2004-06-01), Searles et al.
patent: 2006/0133291 (2006-06-01), Kim et al.
patent: 2006/0146318 (2006-07-01), Adam et al.

Affiliated with

Also associated with

Rating

Method and system of testing device sensitivity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system of testing device sensitivity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system of testing device sensitivity will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2701255