Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2006-10-10
2008-09-02
Barlow, John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C702S082000, C702S083000, C702S084000, C702S181000, C438S010000, C438S012000, C438S018000
Reexamination Certificate
active
07421358
ABSTRACT:
By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.
REFERENCES:
patent: 5866437 (1999-02-01), Chen et al.
patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 2004/0175943 (2004-09-01), Waksman
patent: 2005/0194590 (2005-09-01), Matsushita et al.
patent: 196 13 615 (1996-04-01), None
Advanced Micro Devices , Inc.
Barlow John E.
Kundu Sujoy K
Williams Morgan & Amerson
LandOfFree
Method and system for measurement data evaluation in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for measurement data evaluation in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for measurement data evaluation in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3977831