Method and system for measurement data evaluation in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S082000, C702S083000, C702S084000, C702S181000, C438S010000, C438S012000, C438S018000

Reexamination Certificate

active

07421358

ABSTRACT:
By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.

REFERENCES:
patent: 5866437 (1999-02-01), Chen et al.
patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 2004/0175943 (2004-09-01), Waksman
patent: 2005/0194590 (2005-09-01), Matsushita et al.
patent: 196 13 615 (1996-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for measurement data evaluation in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for measurement data evaluation in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for measurement data evaluation in... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3977831

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.