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Fast evaluation of average critical area for IC layouts

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate

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Fast evaluation of average critical area for ic layouts

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Fast reduction of system models

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Fault dictionaries for integrated circuit yield and quality...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Floorplanning apparatus and computer readable recording...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate

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Focused ion beam defining process enhancement

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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FPGA circuits and methods considering process variations

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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