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X-ray analysis apparatus including goniometer with angle encoder

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray analysis apparatus provided with a double collimator mask

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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X-ray analysis apparatus provided with a multilayer mirror...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analysis apparatus with a graded multilayer mirror

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analysis apparatus with an X-ray detector in the form...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-Ray analysis apparatus with pulse amplitude shift correction

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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X-ray analysis device with X-ray optical semi-conductor...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray analysis instrument

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray analysis instrument with adjustable aperture window

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analytical techniques applied to combinatorial library...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analyzer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray analyzer and X-ray analysis method

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray analyzer and X-ray analysis method

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray analyzer for analyzing plastics

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analyzer system and method of increasing response time

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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X-ray analyzer with self-correcting feature

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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X-ray analyzing apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray analyzing apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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X-ray analyzing apparatus and x-ray irradiation angle setting me

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray analyzing apparatus with enhanced radiation intensity

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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