X-ray analyzing apparatus with enhanced radiation intensity

Details X-ray analyzing apparatus with enhanced radiation intensity X-ray analyzing apparatus with enhanced radiation intensity

1998-08-03

2000-02-22

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 45, 378 49, G01N 23223

Patent

active

060289112

ABSTRACT:
An X-ray analyzing apparatus includes a drive unit for moving a sample, a plurality of field-limiting slits each having a slit size corresponding to the size of a measuring area of the sample, a selector unit for selectively bringing the field-limiting slits into a path of travel of the secondary X-ray between the sample and the detecting unit, a drive controller for controlling the drive unit to move the sample according to the size of the measuring area of the sample to a position at which the intensity of radiation of a primary X-ray towards the measuring area of the sample attains a maximum value; and a selector controller for controlling the selector unit to render only the secondary X-ray emanating from the measuring area of the sample to be incident upon the detecting unit.

REFERENCES:
patent: 5220591 (1993-06-01), Ohsugi et al.
patent: 5249216 (1993-09-01), Ohsugi et al.
patent: 5408512 (1995-04-01), Kuwabara et al.

Affiliated with

Also associated with

Rating

X-ray analyzing apparatus with enhanced radiation intensity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray analyzing apparatus with enhanced radiation intensity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray analyzing apparatus with enhanced radiation intensity will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-526727