X-ray analyzing apparatus

Details X-ray analyzing apparatus X-ray analyzing apparatus

1995-12-08

1997-03-18

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 81, G01N 2320

Patent

active

056129874

ABSTRACT:
An X-ray analyzing apparatus having high sensitivity and high position resolving power in which an X-ray fluorescent screen made of Gd.sub.2 O.sub.2 S:Tb as a material and having a surface density ranging from 5 mg/cm.sup.2 to 30 mg/cm.sup.2 is used, and an image intensifier and a charge coupled device (CCD) are combined to form an X-ray diffraction two-dimensional detector; and the image intensifier and the CCD are combined with a tapered fiber plate, and an alignment section of a mirror mount tube and a vacuum flexible tube are separated by an X-ray window ambient atmosphere and a vacuum.

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patent: 5127039 (1992-06-01), Hesch
patent: 5216252 (1993-06-01), Boone et al.
patent: 5373544 (1994-12-01), Goebel

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