X-ray analysis apparatus including goniometer with angle encoder

Details X-ray analysis apparatus including goniometer with angle encoder X-ray analysis apparatus including goniometer with angle encoder

1992-08-12

1993-12-07

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 73, 378 81, G01N 2320

Patent

active

052689530

ABSTRACT:
An X-ray analysis apparatus includes angle encoders for the determination of angular positions of at least two rotary shafts, for example the .theta. shaft for a specimen holder, the 2.theta. shaft of an X-ray detector arm or the rotary shaft of an X-ray source. Because the angles are directly or indirectly measured relative to a fixed point, preferably coupled to a goniometer frame of the apparatus, accurate angle detection is ensured. The encoders can also be used as adjusting mechanisms for exact, flexible angular adjustment.

REFERENCES:
patent: 3736426 (1973-05-01), Anderson et al.
patent: 4535469 (1985-08-01), Brandt
patent: 4726047 (1988-02-01), Brouwer et al.

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