X-ray analysis instrument

Details X-ray analysis instrument X-ray analysis instrument

2011-07-19

2011-07-19

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S070000

Reexamination Certificate

active

07983386

ABSTRACT:
An apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample. A sample holder is located within an evacuable chamber. An x-ray fluorescence source and separate x-ray diffraction source are mounted within the evacuable chamber. An XRF detection arrangement is also provided, for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the said x-ray fluorescence source. An XRD detection arrangement is then provided for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample. A moveable XRD support assembly is provided, comprising a first part configured to mount the XRD source for relative movement between the XRD source and the sample holder, and a second part configured to mount the XRD detection arrangement for relative movement between the XRD detection arrangement and the sample holder.

REFERENCES:
patent: 2006/0088139 (2006-04-01), Nakano et al.

Affiliated with

Also associated with

Rating

X-ray analysis instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray analysis instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray analysis instrument will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2714708