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Self-verifying temperature sensor

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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Semiconductor arrangement

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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Semiconductor device

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Semiconductor device having variable parameter selection...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Semiconductor device with a tantalum iridium barrier layer conta

Thermal measuring and testing – Temperature measurement – Composite temperature-related paramenter
Patent

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Semiconductor integrated circuit

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Semiconductor integrated circuit with simply configured...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
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Semiconductor laser and fabricating method of the same

Thermal measuring and testing – Determination of inherent thermal property
Reexamination Certificate

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Semiconductor light source temperature measurement

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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Semiconductor substrate temperature determination

Thermal measuring and testing – Temperature measurement – By a vibratory effect
Reexamination Certificate

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Semiconductor temperature detecting method and its circuit

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Semiconductor temperature sensor

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Semiconductor wafer temperature measurement system and method

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Semiconductor wafer temperature measuring device and method

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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Semiconductor wire bond machine leadframe thermal map system

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Reexamination Certificate

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Semiconductor wirebond machine leadframe thermal map system

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Patent

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Semiconductor wirebond machine leadframe thermal map system

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Reexamination Certificate

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Semiconductor wirebond machine leadframe thermal map system

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Reexamination Certificate

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Sensing device for controlling electromagnetic field generator f

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Sensing device for detecting changes in variable quantities

Thermal measuring and testing – Temperature measurement – Mechanical
Patent

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