Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2008-08-27

2011-12-27

Guadalupe-McCall, Yaritza (Department: 2841)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S185000

Reexamination Certificate

active

08083404

ABSTRACT:
A temperature detection circuit includes: a voltage generator that is connected to a first voltage line having first voltage and a second voltage line having second voltage and to output a third voltage to a third voltage line, the third voltage being obtained by transforming the first voltage to be stepped down as an ambient temperature becomes higher; and a detecting unit that includes: a delay section that is connected to the second voltage line and the third voltage line and to receive a pulse signal, the delay section being configured to output a delayed pulse signal that is obtained by delaying the pulse signal for a delay time set to be longer as the third voltage becomes lower; and a temperature detecting section that is configured to: receive the delayed pulse signal and the pulse signal; latch the delayed pulse signal based on the pulse signal; output the latched signal as a detection result.

REFERENCES:
patent: 6255891 (2001-07-01), Matsuno et al.
patent: 6882213 (2005-04-01), Kim
patent: 7078954 (2006-07-01), Watanabe
patent: 7414455 (2008-08-01), Nam et al.
patent: 7459983 (2008-12-01), Gyoten et al.
patent: 7607827 (2009-10-01), Karikomi et al.
patent: 7731417 (2010-06-01), Kumagai
patent: 7969227 (2011-06-01), Hasegawa et al.
patent: 7988354 (2011-08-01), Jansen
patent: 2007/0110123 (2007-05-01), Nam et al.
patent: 2008/0162067 (2008-07-01), Inukai et al.
patent: 2008/0187026 (2008-08-01), Ueda
patent: 2008/0198899 (2008-08-01), Igarashi
patent: 2008/0252360 (2008-10-01), Yoshikawa
patent: 2009/0010301 (2009-01-01), Nagahisa
patent: 2009/0059999 (2009-03-01), Shoda
patent: 2011/0019713 (2011-01-01), Sinha et al.
patent: 2011/0096809 (2011-04-01), Campos et al.
patent: 2011/0158285 (2011-06-01), Igarashi
patent: 10-011157 (1998-01-01), None
patent: 10-260082 (1998-09-01), None
patent: 2007-225477 (2007-09-01), None

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