Semiconductor arrangement

Details Semiconductor arrangement Semiconductor arrangement

1981-03-10

1988-05-17

Cuchlinski, Jr., William A.

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

363 54, 250552, G01K 700, H02H 7125

Patent

active

047446722

ABSTRACT:
In a semiconductor arrangement including at least one semiconductor element composed of a semiconductor material which generates recombination radiation when current flows through the semiconductor element, and a control element disposed for monitoring the operation of the semiconductor element, the control element has an internal photoelectric effect and is disposed for receiving the recombination radiation generated in the semiconductor material for producing an output parameter representative of the intensity of such radiation.

REFERENCES:
patent: 2504628 (1950-04-01), Benzer
patent: 3102201 (1963-08-01), Braunstein
patent: 3217169 (1965-11-01), Grimmeis
patent: 3265990 (1966-08-01), Burns
patent: 3303431 (1967-02-01), Fowler
patent: 3398311 (1968-08-01), Page
patent: 3416047 (1968-12-01), Beale
Conference on "Power Thyristors and Their Applications", May 6-8, 1969, Ssored by The institute of Electrical Engineers, By B. V. Cordingley.

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