Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2011-03-08
2011-03-08
Caputo, Lisa M (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S178000, C327S512000
Reexamination Certificate
active
07901134
ABSTRACT:
Provided is a semiconductor temperature sensor having satisfactory linearity of an output voltage with respect to temperature. In a semiconductor temperature sensor (1), even if the temperature increases and a leakage current is generated at bases of a PNP (8) and a PNP (9), a current which flows into emitters of a PNP (7) and the PNP (8) is not affected by the leakage current by virtue of a leakage current compensation current of a PNP (14), and thus, the linearity of the output voltage with respect to the temperature is improved and the accuracy of the semiconductor temperature sensor (1) with respect to the temperature is improved.
REFERENCES:
patent: 5585752 (1996-12-01), Botti et al.
patent: 6144246 (2000-11-01), Wachter
patent: 2002/0130709 (2002-09-01), Teel et al.
patent: 2004/0130378 (2004-07-01), Kihara
patent: 2007/0285153 (2007-12-01), Hasegawa
patent: 2010/0008398 (2010-01-01), Nojima
patent: 3128013 (2000-11-01), None
Brinks Hofer Gilson & Lione
Caputo Lisa M
Jagan Mirellys
Seiko Instruments Inc.
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