Semiconductor integrated circuit with simply configured...

Details Semiconductor integrated circuit with simply configured... Semiconductor integrated circuit with simply configured...

2006-08-22

2006-08-22

Bennett, G. Bradley (Department: 2859)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

Reexamination Certificate

active

07093975

ABSTRACT:
A clock divider circuit outputs a divided clock. A delay circuit is formed of at least one inverter to delay the divided clock to output a delayed, divided clock. An EXOR circuit receives the divided clock and the delayed, divided clock. A pulse width measurement circuit includes an integration circuit receiving a signal output from a logic circuit, and a Schmitt trigger circuit receiving a signal output from the integration circuit. Since the Schmitt trigger circuit's trigger potential is set to have a value corresponding to a predetermined pulse width, the pulse width measurement circuit outputs a signal asserted in response to a signal received from the logic circuit having a pulse with a width of no less than a predetermined value. A latch circuit latches a signal output from the pulse width measurement circuit.

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Korean Patent Office. Office Action dated Jan. 27, 2006. Korean Application No. 10-2004-0013420. Applicant, Renesas Technology Corp. English Translation. (2 pages).
Korean Patent Office. Office Action dated Jan. 27, 2006. Korean Application No. 10-2004-0013420. Applicant, Renesas Technology Corp. Korean Language. (2 pages).

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