Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1989-12-20
1991-06-18
Yasich, Daniel M.
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
307310, 372 34, G01K 0114, G01K 0700
Patent
active
050245350
ABSTRACT:
A temperature sensing semiconductor device is fabricated in the same substrate as a semiconductor light source. A sensing voltage generated across the sensing device is proportional to light source temperature. The sensing voltage is amplified by an operational amplifier, and converted into a digital signal by an analog to digital converter. A microprocessor converts the digital signal into a corresponding temperature signal using a look-up table.
REFERENCES:
patent: 3973852 (1976-08-01), Moore et al.
patent: 3996451 (1976-12-01), Harrington et al.
patent: 4123938 (1978-11-01), Hamilton
patent: 4215577 (1980-08-01), Griffing et al.
patent: 4243898 (1981-01-01), Seelbach
patent: 4338577 (1982-07-01), Sato et al.
patent: 4484331 (1984-11-01), Miller
patent: 4536851 (1985-08-01), Germanton et al.
patent: 4604753 (1986-08-01), Sawai
patent: 4636092 (1987-01-01), Hegyl
patent: 4768170 (1988-08-01), Hoff
patent: 4808009 (1989-02-01), Sittler et al.
Snider Ronald R.
United Technologies Corporation
Yasich Daniel M.
LandOfFree
Semiconductor light source temperature measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor light source temperature measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor light source temperature measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-142886