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Memory with improved BIST

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Memory with minimized redundancy access delay

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory with power supply intercept in redundancy logic

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory with redundancy

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory with redundancy and predecoded signals

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory with redundant rows and columns

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory with row redundancy

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Memory-cell array and a method for repairing the same

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Memory-cell array and a method for repairing the same

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Method and apparatus for back-end repair of multi-chip modules

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Method and apparatus for built-in self-repair of memory...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for determining the robustness of memory ce

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Method and apparatus for dynamically hiding a defect in an...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for dynamically hiding a defect in an...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for efficient utilization of electronic...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for implementing DRAM redundancy fuse...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for implementing multiple column...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for implementing redundancy in parallel mem

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Method and apparatus for improving yield in semiconductor...

Static information storage and retrieval – Read/write circuit – Bad bit
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Method and apparatus for improving yield in semiconductor...

Static information storage and retrieval – Read/write circuit – Bad bit
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