Method and apparatus for determining the robustness of memory ce

Details Method and apparatus for determining the robustness of memory ce Method and apparatus for determining the robustness of memory ce

1998-09-30

1999-12-07

Nguyen, Tan T.

Static information storage and retrieval

Read/write circuit

Bad bit

365201, 324752, G11C 2900

Patent

active

059994657

ABSTRACT:
Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse having a light pulse energy, applying the light pulse to the device at a predetermined location, varying the light pulse energy, and detecting soft errors in the device. In another embodiment, the apparatus includes a light source for producing a light pulse that is applied to the device at a predetermined location, a light pulse energy varying circuit coupled to the light source and configured to vary the light energy of the light pulse, and a detecting circuit coupled to the device and configured to detecting soft errors in the device.

REFERENCES:
patent: 4335459 (1982-06-01), Miller
patent: 4891584 (1990-01-01), Kamieniecki et al.
patent: 5481551 (1996-01-01), Nakano et al.
patent: 5801540 (1998-09-01), Savaguchi
patent: 5841293 (1998-11-01), Leas

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