Memory with improved BIST

Details Memory with improved BIST Memory with improved BIST

2006-11-27

2010-02-02

Nguyen, Dang T (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S201000, C365S189040

Reexamination Certificate

active

07656726

ABSTRACT:
An integrated circuit device includes an embedded memory having a plurality of memory macros and a built-in-self-test (BIST) circuit coupled to the plurality of memory macros for simultaneous operation of the memory macros, wherein the BIST circuit is configured to select from the memory macros' data outputs an individual memory macro's data output for analysis while the memory macros are operated simultaneously.

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