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Method and apparatus for detecting the endpoint in chemical-mech

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Patent

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Method and apparatus for detecting voltage contrast in a...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method and apparatus for determining and assessing chamber...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for determining critical dimension...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Method and apparatus for determining electromagnetic...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for determining generation lifetime of...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
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Method and apparatus for determining layer thickness and...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for determining process layer conformality

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Method and apparatus for determining the robustness of...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for determining the thickness of a...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for determining two dimensional doping...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for direct probe sensing

Semiconductor device manufacturing: process – With measuring or testing
Patent

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Method and apparatus for dynamic adjustment of a sampling...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for electronically aligning...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for evaluating a known good die using...

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Method and apparatus for evaluating surface roughness of an...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for evaluation and improvement of...

Semiconductor device manufacturing: process – With measuring or testing
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Method and apparatus for high resolution profiling in...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method and apparatus for identifying a wafer cassette

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for identifying failure sites on IC chips

Semiconductor device manufacturing: process – With measuring or testing
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