Monitoring of nitrided oxide gate dielectrics by...

Monitoring system for determining progress in a fabrication...

Monitoring the reduction in thickness as material is removed...

Multi beam scanning with bright/dark field imaging

Multi beam scanning with bright/dark field imaging

Multi beam scanning with bright/dark field imaging

Negative bias critical dimension trim

Optical intensity modifier

Optical processing apparatus and optical processing method

Optical techniques of measuring endpoint during the processing o

Optical techniques of measuring endpoint during the...

Optimization of CMP process by detecting of oxide/nitride...

Optoelectronic packaging submount arrangement providing 90...

Organic light-emitting diode devices having reduced...

PAA-based etchant, methods of using same, and resultant...

Patterned recess formation using acid diffusion

Personalized hardware

Photovoltaic structure with a conductive nanowire array...

Plasma control using dual cathode frequency mixing and...

Plasma emission detection during lateral processing of...