Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2005-11-16
2009-12-22
Purvis, Sue (Department: 2895)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S427000, C438S056000, C438S064000, C257SE25009, C257S136000, C136S243000
Reexamination Certificate
active
07635600
ABSTRACT:
A photovoltaic (PV) structure is provided, along with a method for forming a PV structure with a conductive nanowire array electrode. The method comprises: forming a bottom electrode with conductive nanowires; forming a first semiconductor layer of a first dopant type (i.e., n-type) overlying the nanowires; forming a second semiconductor layer of a second dopant type, opposite of the first dopant type (i.e., p-type), overlying the first semiconductor layer; and, forming a top electrode overlying the second semiconductor layer. The first and second semiconductor layers can be a material such as a conductive polymer, a conjugated polymer with a fullerene derivative, and inorganic materials such as CdSe, CdS, Titania, or ZnO. The conductive nanowires can be a material such as IrO2, In2O3, SnO2, or indium tin oxide (ITO).
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Barrowcliff Robert A.
Hsu Sheng Teng
Zhang Fengyan
Law Office of Gerald Maliszewski
Maliszewski Gerald
Purvis Sue
Sharp Laboratories of America Inc.
Singal Ankush k
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