Scanning interference electron microscope

Scanning probe with digitized pulsed-force mode operation...

Scanning transmission electron microscope

Scanning transmission electron microscope and scanning...

Scanning transmission electron microscope and scanning...

Scanning transmission electron microscope and scanning...

Scanning transmission electron microscopes

Scanning type electron microscope

Self-cleaning technique for contamination on calibration...

SEM for transmission operation with a location-sensitive...

SEM inspection and analysis of patterned photoresist features

Source for intense coherent electron pulses

Specimen inspection equipment and how to make electron beam...

Standard reference for metrology and calibration method of...

Standard sample for transmission electron microscope (TEM)...

Standard specimen for a charged particle beam apparatus,...

Stress measuring method and system

Stress measuring method and system

Structure determination of materials using electron microscopy

Support stand for a corpuscular-beam microscope