Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate
2005-12-06
2008-08-26
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
C250S492100, C250S306000, C257S014000, C257S010000, C257S009000, C257S028000, C257S030000, C438S003000, C438S105000
Reexamination Certificate
active
07417227
ABSTRACT:
The conventional detection technique has the following problems in detecting interference fringes: (1) Setting and adjustment are complex and difficult to conduct; (2) A phase image and an amplitude image cannot be displayed simultaneously; and (3) Detection efficiency of electron beams is low. The invention provides a scanning interference electron microscope which is improved in detection efficiency of electron beam interference fringes, and enables the user to observe electric and magnetic information easily in a micro domain of a specimen as a scan image of a high S/N ratio under optimum conditions.
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Tanji, T., Ru Q., Tonomura, A., “Differential microscopy by conventional electron off-axis holography”, Appl. Phys. Lett. 69, 18, 1996.
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Koguchi Masanari
Matsumoto Takao
A. Marquez, Esq. Juan Carlos
Fisher Esq. Stanley P.
Hitachi High-Technologies Corporation
Reed Smith LLP
Sahu Meenakshi S
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