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Stage device for an exposure apparatus and semiconductor...

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate

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Stage devices including linear motors that produce reduced...

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Stress cell for a scanning probe microscope

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate handling apparatus and ion implantation apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate holding unit, exposure apparatus, and device...

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate positioning system

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate positioning system

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate processing apparatus and method

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Substrate processing apparatus and method

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Support material for electron beam systems

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Surface analyzing and processing apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Surface characterization apparatus and method

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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System and method for cooling workpieces processed by an ion imp

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System and method for electron beam irradiation

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System and method for electron beam irradiation

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System and method for electron-beam lithography

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System and method for processing an object

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System and method for semiconductor processing using polarized r

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System for circular and complex tomography

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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System for correcting eccentricity and rotational error of a wor

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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