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Selected: P

Pattern area ratio measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern comparison

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Pattern defect detection device and a spatial frequency filter u

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Pattern defect inspecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Pattern defect inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Pattern defect inspection apparatus and method

Optics: measuring and testing – Plural test
Reexamination Certificate

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Pattern defect inspection method, photomask manufacturing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Pattern detecting apparatus

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Pattern detection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern detector

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Pattern detector

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Pattern evaluation apparatus and a method of pattern evaluation

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern exposure apparatus with distance measuring system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Pattern forming apparatus, mark detecting apparatus,...

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate

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Pattern forming method and light exposure apparatus

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Pattern generator part holder

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Pattern inspecting method and pattern inspecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Pattern inspecting method and pattern inspecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Pattern inspecting system and pattern inspecting method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Pattern inspecting system and pattern inspecting method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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