4. Optics: measuring and testing
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Inspecting device for semiconductor wafer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspecting end surfaces of fiber optic connectors

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Inspecting method for disk used in photo film cassette

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Inspecting method for mask for producing semiconductor device

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Inspecting system for security documents

Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate

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Inspecting system for security documents

Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate

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Inspecting the surface of an object

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Inspection and retrieval device

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

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Inspection apparatus

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections
Patent

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Inspection apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Inspection apparatus and inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspection apparatus and inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspection apparatus and inspection method

Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate

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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Inspection apparatus and method for optical system, exposure app

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Inspection apparatus and method of inspection

Optics: measuring and testing – Dimension
Reexamination Certificate

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Inspection apparatus and method of inspection

Optics: measuring and testing – Dimension
Reexamination Certificate

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Inspection apparatus and method, and production method for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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