Inspection apparatus and method

Details Inspection apparatus and method Inspection apparatus and method

2008-12-31

2010-11-16

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

C356S614000, C382S154000, C348S059000

Reexamination Certificate

active

07834996

ABSTRACT:
An optical plate having an exit pupil array or a lens array aligned at a predetermined pitch is disposed at the front of a display. A test pattern is supplied to the display to light a pixel corresponding to the predetermined pitch. A first optical element transmits a light from an inspection position of the optical plate. A second optical element coaxially disposed on the first optical element, focuses the light from the first optical element. An image from the light focused at the second optical element is obtained. A three-dimensional position at the inspection position of the optical plate relative to the display or a predetermined period of the optical plate is calculated from a position and a period of luminance distribution of the image, and a distance between the optical plate and the first optical element. Whether the three-dimensional position or the predetermined period is within a threshold is inspected.

REFERENCES:
patent: 6462871 (2002-10-01), Morishima
patent: 7433110 (2008-10-01), Momonoi et al.
patent: 7586662 (2009-09-01), Momonoi et al.
patent: 2007/0057145 (2007-03-01), Momonoi et al.
patent: 2008/0239065 (2008-10-01), Momonoi et al.
patent: 2009/0168054 (2009-07-01), Choi
patent: 2010/0073463 (2010-03-01), Momonoi et al.
patent: 07-140041 (1995-06-01), None
patent: 2006-112991 (2006-04-01), None
patent: 2007-102201 (2007-04-01), None

Affiliated with

Also associated with

Rating

Inspection apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4226980