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In-line, concurrent electromagnetic beam analyzer

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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In-motion dimensioning system and method for cuboidal objects

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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In-motion dimensioning system for cuboidal objects

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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In-phase/in-quadrature demodulator for spectral information...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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In-plane optical metrology

Optics: measuring and testing – Of light reflection
Reexamination Certificate

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In-process film thickness monitoring system

Optics: measuring and testing – With plural diverse test or art
Patent

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In-process vision detection of flaws and FOD by back field...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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In-situ absolute measurement process and apparatus for film...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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In-situ automated contactless thickness measurement for...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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In-situ critical dimension measurement

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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In-situ defect monitor and control system for immersion...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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In-situ detection and analysis of methane in coal bed...

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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In-situ detection and analysis of methane in coal bed...

Optics: measuring and testing – For light transmission or absorption – By comparison
Reexamination Certificate

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In-situ endpoint detection for membrane formation

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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In-situ film thickness measurement using spectral...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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In-situ gas analyzer

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

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In-situ measurement of a thin film deposited on a wafer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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In-situ metalization monitoring using eddy current and...

Optics: measuring and testing – With plural diverse test or art
Reexamination Certificate

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In-situ method and apparatus for end point detection in...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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In-situ method and apparatus for end point detection in...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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