Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2011-01-04
2011-01-04
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
C356S497000
Reexamination Certificate
active
07864327
ABSTRACT:
Sinusoidal in-phase and in-quadrature signals at a given spatial frequency are combined with the irradiance signals generating a correlogram of interest and integrated over the length of the correlogram data-acquisition scan. The integration outputs are then used to calculate the amplitude and the phase of the correlogram signal at the selected spatial frequency, thereby producing targeted spectral information. The signal generator used to generate the in-phase and in-quadrature sinusoidal signals may be scanned advantageously through any desired range of spatial frequencies, thereby producing corresponding amplitude and phase spectral information for the correlogram. Because the procedure produces spectral information independently of the number of data frames acquired during the interferometric scan, it is materially more rapid than conventional FFT analysis.
REFERENCES:
patent: 2003/0023153 (2003-01-01), Izatt et al.
patent: 2004/0196468 (2004-10-01), Wang et al.
patent: 2004/0252393 (2004-12-01), Wang et al.
patent: 2005/0185187 (2005-08-01), Dorrer
Connolly Patrick J
Durando Antonio R.
Veeco Instruments Inc.
LandOfFree
In-phase/in-quadrature demodulator for spectral information... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with In-phase/in-quadrature demodulator for spectral information..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and In-phase/in-quadrature demodulator for spectral information... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2702111