Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2008-07-25
2009-08-18
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237300
Reexamination Certificate
active
07576850
ABSTRACT:
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
REFERENCES:
patent: 3243509 (1966-03-01), Stut
patent: 3879245 (1975-04-01), Fetherson et al.
patent: 4064534 (1977-12-01), Chen et al.
patent: 4120402 (1978-10-01), Swanson
patent: 4135204 (1979-01-01), Davis et al.
patent: 4310132 (1982-01-01), Frosch et al.
patent: 4437115 (1984-03-01), Yoshida
patent: 4445185 (1984-04-01), Davis, Jr. et al.
patent: 4548859 (1985-10-01), Kline et al.
patent: 4608220 (1986-08-01), Caldwell et al.
patent: 4672678 (1987-06-01), Koezuka et al.
patent: 4693678 (1987-09-01), Von Volkli
patent: 4699683 (1987-10-01), McCowin
patent: 4706296 (1987-11-01), Pedotti et al.
patent: 4760444 (1988-07-01), Nielson et al.
patent: 4780262 (1988-10-01), Von Volkli
patent: 4790023 (1988-12-01), Matsui et al.
patent: 4790898 (1988-12-01), Woods
patent: 4830298 (1989-05-01), Van Blunk
patent: 4877471 (1989-10-01), McCowin et al.
patent: 4941182 (1990-07-01), Patel
patent: 4975863 (1990-12-01), Sistler et al.
patent: 5007096 (1991-04-01), Yoshida
patent: 5012523 (1991-04-01), Kobayashi et al.
patent: 5016099 (1991-05-01), Bongardt et al.
patent: 5024399 (1991-06-01), Barquet et al.
patent: 5032211 (1991-07-01), Shinno et al.
patent: 5058174 (1991-10-01), Carroll
patent: 5058497 (1991-10-01), Bishop et al.
patent: 5187573 (1993-02-01), Yoshida
patent: 5198983 (1993-03-01), Blake et al.
patent: 5231675 (1993-07-01), Sarr et al.
patent: 5237407 (1993-08-01), Crezee et al.
patent: 5253302 (1993-10-01), Massen
patent: 5258917 (1993-11-01), Bruder et al.
patent: 5263094 (1993-11-01), Laitinen et al.
patent: 5331312 (1994-07-01), Kudoh
patent: 5333208 (1994-07-01), Massen
patent: 5337647 (1994-08-01), Roberts et al.
patent: 5426509 (1995-06-01), Peplinski
patent: 5439549 (1995-08-01), Fryc et al.
patent: 5440650 (1995-08-01), Hieda et al.
patent: 5450147 (1995-09-01), Dorsey-Palmateer
patent: 5452370 (1995-09-01), Nagata
patent: 5486819 (1996-01-01), Horie
patent: 5518208 (1996-05-01), Roseburg
patent: 5533628 (1996-07-01), Tao
patent: 5540126 (1996-07-01), Piramoon
patent: 5562788 (1996-10-01), Kitson et al.
patent: 5626471 (1997-05-01), Howie et al.
patent: 5646682 (1997-07-01), Sogabe et al.
patent: 5651600 (1997-07-01), Dorsey Palmateer
patent: 5652432 (1997-07-01), Yaginuma
patent: 5683646 (1997-11-01), Reiling et al.
patent: 5700337 (1997-12-01), Jacobs et al.
patent: 5703784 (1997-12-01), Pearson
patent: 5732147 (1998-03-01), Tao
patent: 5742504 (1998-04-01), Meyer et al.
patent: 5746553 (1998-05-01), Engwall
patent: 5804276 (1998-09-01), Jacobs et al.
patent: 5814386 (1998-09-01), Vasiliev et al.
patent: 5825495 (1998-10-01), Huber
patent: 5862372 (1999-01-01), Morris et al.
patent: 5871117 (1999-02-01), Protasov et al.
patent: 5917588 (1999-06-01), Addiego
patent: 5963660 (1999-10-01), Koontz et al.
patent: 5979531 (1999-11-01), Barr et al.
patent: 6012883 (2000-01-01), Engwall et al.
patent: 6013341 (2000-01-01), Medvedev et al.
patent: 6026883 (2000-02-01), Hegerhorst et al.
patent: 6045651 (2000-04-01), Kline et al.
patent: 6064429 (2000-05-01), Belk et al.
patent: 6074716 (2000-06-01), Tsotsis
patent: 6086696 (2000-07-01), Gallaher
patent: 6087654 (2000-07-01), Durham et al.
patent: 6112792 (2000-09-01), Barr et al.
patent: 6122065 (2000-09-01), Gauthier
patent: 6168358 (2001-01-01), Engwall et al.
patent: 6205239 (2001-03-01), Lin et al.
patent: 6229972 (2001-05-01), Rushing
patent: 6364250 (2002-04-01), Brinck et al.
patent: 6369492 (2002-04-01), Sugimoto
patent: 6381366 (2002-04-01), Taycher et al.
patent: 6390169 (2002-05-01), Johnson
patent: 6408429 (2002-06-01), Marrion, Jr. et al.
patent: 6451152 (2002-09-01), Holmes
patent: 6480271 (2002-11-01), Cloud et al.
patent: 6542235 (2003-04-01), Caskey et al.
patent: 6547769 (2003-04-01), Van Tassel et al.
patent: 6639662 (2003-10-01), Vaez-Iravani et al.
patent: 6648273 (2003-11-01), Anast
patent: 6692681 (2004-02-01), Lunde
patent: 6723951 (2004-04-01), McGraw
patent: 6725123 (2004-04-01), Denuell
patent: 6744913 (2004-06-01), Guest et al.
patent: 6799619 (2004-10-01), Holmes et al.
patent: 6814822 (2004-11-01), Holmes
patent: 6871684 (2005-03-01), Engelbart et al.
patent: 7039485 (2006-05-01), Engelbart
patent: 7048024 (2006-05-01), Clark
patent: 7080441 (2006-07-01), Braun
patent: 7083698 (2006-08-01), Engwall
patent: 7134629 (2006-11-01), Johnson
patent: 7137182 (2006-11-01), Nelson
patent: 7159822 (2007-01-01), Grantham et al.
patent: 7171033 (2007-01-01), Engelbart
patent: 7193696 (2007-03-01), Engelbart
patent: 7228611 (2007-06-01), Anderson
patent: 7236625 (2007-06-01), Engelbart et al.
patent: 7263625 (2007-08-01), Katoh et al.
patent: 7282107 (2007-10-01), Johnson
patent: 7289656 (2007-10-01), Engelbart
patent: 7325771 (2008-02-01), Stulc
patent: 2003/0102070 (2003-06-01), Black et al.
patent: 2006/0073309 (2006-04-01), Hogg
patent: 0319797 (1989-06-01), None
patent: 0833146 (1998-01-01), None
patent: 0903574 (1998-01-01), None
patent: 1030172 (2000-08-01), None
patent: 1334819 (2003-08-01), None
patent: 1503206 (2005-02-01), None
patent: 2001012930 (2001-01-01), None
patent: 94/18643 (1994-08-01), None
patent: 2004/025385 (2004-03-01), None
R. Paulson et al., Infrared Imaging Techniques for Flaw Detection in Composite Materials, Lockheed Missiles and Space Company, Inc., Sunnyvale, CA, pp. 88-95.
Lichtenwalner, P.F., Neural Network-Based Control for the Fiber Placement Composite Manufacturing Process, Journal of Materials Engineering and Performance, vol. 2(5), Oct. 1993, p. 687.
Wang, Eric L., Effects of Laps and Gaps on the Processing of Advanced Thermoplastic Composites, Thesis, Massachusetts Institute of Technology, Jan. 1991.
Krupka, R; Walz, T; Ettemeyer, A: “Industrial Applications of Shearography for Inspection of Aircraft Components” Proceedings of the 8th European Conference of Nondestructicve Testing< Barcelona (Spain), Jun. 17-21, 2002, ′Online! Jun. 30, 2002, XP002351899 NDT.NET—Feb. 2003, vol. 8, No. 2 Retrieved from the Internet: URL:http://www.ndt.net/articl/encndt02/484/484.htm> 'retrieved on Oct. 31, 2005.
The Written Opinion for International Application PCT/US2004/039905, dated May 25, 2005 6 pages.
International Search Report dated May 25, 2005 for report for International Application PCT/US2004/039905, dated Nov. 30, 2004, 4 pages.
Prof. J. Zhang: “Angewandte Sensorik” Ch. 4, Sensoren in Der Robotik, Nov. 11, 2003; (retrieved from the Internet, URL:http://tech-www.Informatik.uni-hamburgnsorik/vorlesung—03.pdf) retrieved on Apr. 2004! p. 89, 20 pages.
European Search Report, Application No. 04076900.2, dated Dec. 1, 2004, 4 pages.
Fiedler, L., et al, “Tango Composite Fuselage Platform”, SAMPE Journal, vol. 39, No. 1, Jan./Feb. 2003, pp. 57-63.
Advanced Technology Tape Laying for Affordable Manufacturing of Large Composite Structures; http://www.cinmach.com/tech/pdf/TapeLayingGrimshaw.pdf; Michael N. Grimshaw, et al; 11 pages.
Fiber Placement; http://www.cinmach.com/tech/pdf/asm—chapter—fp.pdf; Don O. Evans; Cincinnati Machine; 3 pages.
Automated Tape Laying; http://www.cinmach.com/tech/pdf/Grimshaw%20ASM%20Handbook.pdf; Michael N. Grimshaw; Cincinnati Machine; 6 pages.
Raytheon Aircraft's Hawker Horizon Reaches Fuselage Milestone, Raytheon News Release; http://www.beechcraft.de/Presse/2000/100900b.htm; 2 pages.
BAe 146, Flight International, May 2, 1981, 2 pages.
A Barrelful of Experience, Intervia, May 1992, 2 pages.
Raytheon, Mar. 2000, vol. 4, No. 2, http://www.cs.com/king/vasci
ewsletter/vol42.html, 2 page
Engelbart Roger W.
Hannebaum Reed
Pollock Tim
Lyons Michael A
Ostrager Chong & Flaherty & Broitman P.C.
The Boeing Company
Ton Tri T
LandOfFree
In-process vision detection of flaws and FOD by back field... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with In-process vision detection of flaws and FOD by back field..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and In-process vision detection of flaws and FOD by back field... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4084361