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Controlled machining of combustion chambers, gears and other sur

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Coordinate measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Coordinated polarization for shiny surface measurement

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Correcting the system polarization sensitivity of a...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Cross optical axis inspection system for integrated circuits

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Dark field surface inspection illumination technique

Optics: measuring and testing – By polarized light examination – With polariscopes
Patent

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Dark field, photon tunneling imaging probes

Optics: measuring and testing – By polarized light examination – With light attenuation
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Dark field, photon tunneling imaging systems and methods

Optics: measuring and testing – By polarized light examination – With light attenuation
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Dark field, photon tunneling imaging systems and methods for mea

Optics: measuring and testing – By polarized light examination – With light attenuation
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Dark field, photon tunneling imaging systems and methods for opt

Optics: measuring and testing – By polarized light examination – With light attenuation
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Datum sensing using optical grating

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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DC Shift error correction for electro-optical measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Deflection unit

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Delay time measurement apparatus for optical element

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Depolarized light scattering array apparatus and method of using

Optics: measuring and testing – By polarized light examination – With polariscopes
Patent

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Depth measuring apparatus for a dredger

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Dermoscopy epiluminescence device employing cross and...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Dermoscopy epiluminescence device employing cross and...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Dermoscopy epiluminescence device employing multiple color...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Dermoscopy epiluminescence device employing multiple color...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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