Depolarized light scattering array apparatus and method of using

Details Depolarized light scattering array apparatus and method of using Depolarized light scattering array apparatus and method of using

1998-10-19

2000-12-05

Font, Frank G.

Optics: measuring and testing

By polarized light examination

With polariscopes

356364, 356365, 356345, 356351, G01J 400

Patent

active

06157449&

ABSTRACT:
A method and apparatus for characterizing and scanning an array of material samples in a combinatorial library in parallel is disclosed. The apparatus includes a sample block having a plurality of regions for containing the material samples, a polarized light source to illuminate the materials, an analyzer having a polarization direction oriented 90.degree. relative to the polarization direction of the polarized light source so as to filter out light intensities having the same polarization direction as the incident light beams from the light source after illuminating the material samples, and a detector for analyzing changes in the intensity of the light beams. In one aspect, the light source in combination with a polarizer, includes a plurality of light beams to simultaneously illuminate the entire array of materials with linearly polarized light such that the characterization can be performed quickly. In another aspect, the materials in the sample block are subjected to different environmental conditions wherein the detector analyzes the array as a function of those environmental conditions.

REFERENCES:
patent: 5257092 (1993-10-01), Noguchi et al.
patent: 5694205 (1997-12-01), Gualtieri et al.
patent: 5788632 (1998-08-01), Pezzaniti et al.
patent: 6031614 (2000-02-01), Michaelis et al.

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