Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-07-14
1988-03-29
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, 356375, G01B 1102
Patent
active
047339683
ABSTRACT:
Apparatus for detecting a datum position in a range of movement of a movable member, comprises a composite grating comprising first and second gratings. The first grating has first and second grating halves and the second grating has third and fourth grating halves which are respectively identical to the first and second grating halves except that the third and fourth grating halves are separated by a spacing. The image of the third grating half is reflected upon the image of the first grating half, the image of the second grating half upon the fourth grating half, the first grating half upon the third grating half and the fourth grating half upon the second grating half. A quadrant detector detects the intensity of the interference images and provides a difference signal which passes through zero at the datum position of the member.
REFERENCES:
patent: 3364813 (1968-01-01), McKinney
patent: 4097734 (1978-06-01), Erickson
Pettigrew Robert M.
Robinson Laurence J.
Dr. Johannes Heidenhain GmbH
Koren Matthew W.
Willis Davis L.
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